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Test equipment
Industry: Semiconductors
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Test equipment
Bypass register (BSR)
Semiconductors; Test equipment
A single-bit register applied in parallel to the BSR that reduces the device's scan shift-path to only 1 bit.
Digital to analogue (D/A) converter (DAC)
Semiconductors; Test equipment
An electronic device, which takes input information in digital form and converts it to an analogue output containing the same information.
Decibel carrier level (dBc/Hz)
Semiconductors; Test equipment
Level difference referred to carrier level calculated for a measurement bandwidth of 1 Hz. (Spectrum and network analysis.)
Direct current (DC)
Semiconductors; Test equipment
Current flow in only one direction (as opposed to alternating current or AC when current flows both forward and backward).
Core test language (CTL)
Semiconductors; Test equipment
Extensions to IEEE standard 1450 (STIL) to address test aspects of cores.
Decibel microvolt (dBµV)
Semiconductors; Test equipment
Absolute voltage level referred to 1 µV (0 dBµV = 1 µV)
Decibel noise (dBa0)
Semiconductors; Test equipment
Noise power measured at zero transmission level point.
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