Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Tera (T)

Semiconductors; Test equipment

One trillion = 1,000 Giga = 1,000,000,000,000

Testability management action group (TMAG)

Semiconductors; Test equipment

The Testability Management Action Group (TMAG) is a grass roots organisation made up of test professionals who believe that success for Testability in general, and Design for Testability (DFT) in ...

Test, measurement, and diagnostic equipment (TMDE)

Semiconductors; Test equipment

A system or device that can be used to evaluate the operational condition of a system or component to identify or isolate any actual or potential malfunction. Diagnostic and prognostic equipment, ...

Test requirements document (TRD)

Semiconductors; Test equipment

An item specification that contains the required performance characteristics of a UUT and specifies the test conditions, values (and allowable tolerances) of the stimuli, and associated responses ...

Through silicon via (TSV)

Semiconductors; Test equipment

The process of creating the contact via in silicon in order to establish an electrical connexion from the active side to the backside of the die, thus creating options for 3D integration.

Test programme set (TPS)

Semiconductors; Test equipment

The combination of test program, interface device, test programme instruction, and supplementary data required to initiate and execute a given test of a Unit Under Test.

True root-mean-square

Semiconductors; Test equipment

(True rms) - A term used to distinguish metres that actually measure the root-mean-square value, from metres that derive rms levels from either peak or average values.