8 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Boundary scan (BScan/JTAG)
Semiconductors; Test equipment
Boundary Scan means no less than "getting rid of the nail", so the bed-of-nail adaptation getting more and more difficult is dropped but the advantage is maintained, i.e. the testing within the ...
Boundary-scan description language (BSDL)
Semiconductors; Test equipment
A language, similar to and a subset of VHDL, used by semiconductor vendors to describe the boundary-scan behaviour of their IEEE 1149.1-compliant devices.
Criticality analysis (CA)
Semiconductors; Test equipment
A procedure by which each potential failure mode is ranked according to the combined influence of severity and probability of occurrence.
Computer aided design (CAD)
Semiconductors; Test equipment
A computer based system to assist designers in the design, topological layout and drawing of an electronic component, assembly, or system.
Boundary-scan (BScan)
Semiconductors; Test equipment
The use of a serial scan-shift register called the Boundary-Scan Register (BSR) to provide controllability and observability of device I/O pins.
Boundary scan register (BSR)
Semiconductors; Test equipment
A serial shift register of Boundary-Scan cells that is used to observe and control the pins of a chip.
Computer aided accuracy (CAA)
Semiconductors; Test equipment
Automatic consideration of the systematic residual deviations determined by highly exact measurement.
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