Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Programmable read-only memory (PROM)

Semiconductors; Test equipment

A programmable logic device in which the OR array is programmable but the AND array is pre-defined. Usually considered to be a memory device whose contents can be electrically programmed (once) by ...

Pseudo random pattern generator (PRPG)

Semiconductors; Test equipment

PRPGs are LFSRs that are sometimes used on the front end of BIST engines to generate pseudo-random patterns to be presented to a circuit under test.

Plastic quad flat pack (PQFP)

Semiconductors; Test equipment

An FP with leads on fours sides. Generally refers to a plastic quad flat package that is built to JEDEC standards.

Printed wiring assembly (PWA)

Semiconductors; Test equipment

The generic term for a PWB after all electrical components have been attached.

Precision time protocol (PTP)

Semiconductors; Test equipment

The name used in the IEEE-1588 standard for the protocol.

Remaining useful life (RUL)

Semiconductors; Test equipment

Represents the expected time the group, or a member of the group, is expected to survive after the analysis date. The care and servicing by personnel for the purpose of maintaining equipment and ...

Real time system integration bus (RTSI)

Semiconductors; Test equipment

A dedicated high-speed digital bus designed to facilitate systems integration by low-level, high-speed, real-time communication between National Instruments boards. Using RTSI, motion boards can ...