Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Amplifier

Semiconductors; Test equipment

A circuit that increases the voltage, current, or power of a signal.

Defect based test (DBT)

Semiconductors; Test equipment

Test development philosophy (mind set) that begins by looking at the fab's defect densities, the circuit layout and the creating test sets that will uncover the defects most likely to affect the ...

Phase alternation line (PAL)

Semiconductors; Test equipment

A 50-Hz composite colour video standard used in Western Europe, India, China, and some Middle Eastern countries. Seealso NTSC, RS-170.

Level sensitive scan design (LSSD)

Semiconductors; Test equipment

Type of scan design that uses master/slave latches which have different clock phases to isolate each scan node.

Noise floor

Semiconductors; Test equipment

(1) The level below which no information can be obtained from a signal. A signal that occurs below a noise floor is permanently lost. (2)The minimum discernible signal that can be detected by a ...

Direct memory access (DMA)

Semiconductors; Test equipment

With respect to test, DMA refers to an architecture that allows direct addressability and observability of embedded memories.

Pixel

Semiconductors; Test equipment

(1) The fundamental picture element in a digital image. (2) The coordinate unit used to define the horizontal location of a pixel in an image. ("Pixel" is an acronym for "picture element.")