6 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Supportability analyses (SA)
Semiconductors; Test equipment
A wide range of related analyses that should be conducted within the system's engineering process. The goals of supportability analyses are to ensure that supportability is included as a system ...
Sandia controllability and observability analysis programme (SCOAP)
Semiconductors; Test equipment
A method used to determine design testability; often used for scan or test point selection.
Standard commands for programmable instruments (SCPI)
Semiconductors; Test equipment
An extension of the IEEE 488.2 standard defining standard programming commands and syntax for device operations.
Surface barrier diode
Semiconductors; Test equipment
(Schottky diode) High speed diode that has very little junction capacitance. Also known as a "hot-carrier diode."
Return-to-zero (RZ)
Semiconductors; Test equipment
A digital wave format. When a valid bit is present, the waveform switches to a "1," then back to a "0" within the same cycle.
Read-write memory (RWM)
Semiconductors; Test equipment
An alternative (and possibly more appropriate) name for a random access memory.
