Test equipment

Test equipment

Industry: Semiconductors

Add a new term

Contributors in Test equipment

Become a Contributors

Test equipment

Single point failure mode (SPFM)

Semiconductors; Test equipment

The way or manner in which the sinlge point failure of an item occurs.

Single pole single throw (SPST)

Semiconductors; Test equipment

Two terminal switch or relay thet can open or close one circuit.

Universal asynchronous receiver transmitter (UART)

Semiconductors; Test equipment

Serial data protocol that transfers data at set data (baud) rates. These data rates are based on transitions of the data at set time periods; no clock is transmitted between the transmitter and ...

Test uncertainty ratio (TUR)

Semiconductors; Test equipment

A requirement in calibration that a standard be a certain integer number of times better than the products being compared to them. TURs used to be 10:1, but are now ofter 4:1 or even 3:1.

Time-triggered protocol (TTP)

Semiconductors; Test equipment

A communication protocol whereby all activities are carried out at certain times known a priori, and all nodes have a common notion of time, based on approximate synchronisation

Ultra large scale integration (ULSI)

Semiconductors; Test equipment

Refers to the number of logic gates in a device. By one convention, ultra-large-scale integration represents a device containing a million or more gates.

Micro

Semiconductors; Test equipment

(u) - Representing one millionth = 0.000001. The abbreviation generally uses the Greek symbol mu, which looks similar to the English letter u. For example, one millionth of a second could be ...