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Test equipment
Industry: Semiconductors
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Test equipment
Weapons replaceable assembly (WRA)
Semiconductors; Test equipment
A generic term that refers to a part of an equipment which is separately installed/replaced in the aircraft.
Wrapper-serial-input (WSI)
Semiconductors; Test equipment
A IEEE Std 1500 TAM signal that is the beginning of the serial scan-path for the IEEE Std 1500 Test Wrapper.
Wrapper-serial-output (WSO)
Semiconductors; Test equipment
A IEEE Std 1500 TAM signal that is the end of the serial scan-path for the IEEE Std 1500 Test Wrapper.
Admittance (Y)
Semiconductors; Test equipment
(symbol "Y") Measure of how easily AC will flow through a circuit. Admittance is the reciprocal of impedance and is measured in siemens.
Reactance (X)
Semiconductors; Test equipment
Opposition to current flow without the dissipation of energy. Example: The opposition provided by inductance or capacitance to AC current.
Extensible markup language (XML)
Semiconductors; Test equipment
A formal specification of the World Wide Web Consortium (W3C).
Electrolytic capacitor
Semiconductors; Test equipment
A capacitor having an electrolyte between the two plates. A thin layer of oxide is deposited on only the positive plate. The oxide acts as the dielectric for the capacitor. Electrolytic capacitors ...
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22 Terms