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Test equipment
Industry: Semiconductors
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Test equipment
Emitter coupled logic (ECL)
Semiconductors; Test equipment
Logic gates implemented using particular configurations of bipolar junction transistors. Generally used for high-speed applications.
Equivalent focal length (EFL)
Semiconductors; Test equipment
The focal length of an infinitely thin lens having the same paraxial imaging properties as a thick lens or multiple-element system.
Extended data out DRAM (EDO DRAM)
Semiconductors; Test equipment
Type of Dynamic Random Access Memory (DRAM) that is faster than conventional DRAM.
Electroencephalogram (EEG)
Semiconductors; Test equipment
An instrument used to make brain wave measurements.
Floating-point operations per second (FLOPS)
Semiconductors; Test equipment
A common benchmark measurement for rating the speed of microprocessors. Floating-point operations include any operations that involve fractional numbers. Such operations, which take much longer to ...
Functional magnetic resonance imaging
Semiconductors; Test equipment
(fMRI) - In addition to scanning for the spin of electrons, scientists are also scanning for our desires and emotional responses, scouring our brain for clues using this technology. Also detects the ...
Geometric centre frequency (Fo)
Semiconductors; Test equipment
Fo = Square root of (Fc1*Fc2) where Fc is a Corner Frequencey. Used to specify Fo for band-pass or band-reject filters.
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