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Test equipment
Industry: Semiconductors
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Test equipment
Hypertext transfer protocol
Semiconductors; Test equipment
(http) - The protocol used to transfer Web pages between a Web Server and a browser. A set of instructions for communications between a server and a world wide web client. It is the main protocol ...
Hierarchical scan description language (HSDL)
Semiconductors; Test equipment
Developed by Texas Instruments this superset of the Boundary Scan Description Language (BSDL) provides information about board-level and system-level interconnection of IEEE-1149.1 signals.
I/O buffer information specification (IBIS)
Semiconductors; Test equipment
A standard simulation format used to model the behaviour of an integrated circuit's input/output (I/O) pins. Used in designing and simulating the operation of circuit buses.
High speed serial interface (HSSI)
Semiconductors; Test equipment
The HSSI interface uses differential ECL lines to transmit data at 52Mbps out to a maximum distance of 50 feet, also EIA613.
Health management (HM)
Semiconductors; Test equipment
The capability of monitoring real-time sensors to determine the health and performance of a system, subsystem, device or process. It may or may not be hosted on the system being monitored.
High speed 488
Semiconductors; Test equipment
(HS488) - A high-speed data transfer protocol for IEEE 488. This protocol increases performance for GPIB reads and writes up to 8 Mbytes/s, depending on your system.
Input/output (I/O)
Semiconductors; Test equipment
I/O refers to any operation, program, or device whose purpose is to enter data into a computer or to extract data from a computer.