18 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
Finite impulse response philtre (FIR filter)
Semiconductors; Test equipment
Intellectual Property used in DSP applications used to philtre out different frequencies.
Centre frequency (Fo)
Semiconductors; Test equipment
Defined for BAND-PASS and BAND-REJECT philtres as the frequency at the geometric mean of two corner frequencies (usually -3 dB).
Fully mission capable (FMC)
Semiconductors; Test equipment
The system is in full working order, capable of performing any of its assigned missions.
Frequency modulation (FM)
Semiconductors; Test equipment
An analogue modulation technique whereby the frequency of a carrier is varied to encode information.
First In first out memory (FIFO)
Semiconductors; Test equipment
Type of memory that reads out data in the order received.
Inter-integrated circuit
Semiconductors; Test equipment
(I2C or IIC) - A serial interface useful for communicating with other peripheral or microcontroller devices. The I2C module contains independent I2C master logic and I2C slave logic, each generating ...
