Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Carrier sense multiple access/ collision detect protocol (CSMA/CD)

Semiconductors; Test equipment

With CSMA/CD two or more stations share a common transmission medium. To transmit a frame, a station must wait for an idle period on the medium when no other station is transmitting. It then ...

C-mode scanning acoustic microscope (C-SAM)

Semiconductors; Test equipment

An ultra high frequency pulse-echo ultrasonic imaging system that is used to look inside optically opaque samples and view internal features such as defects and construction details. Fundamentally, ...

Central processing unit (CPU)

Semiconductors; Test equipment

The core circuitry of a computer including the ALU (arithmetic logic unit), address-control circuitry, and bus-control circuitry. Usually implemented with a microprocessor or microcontroller in an ...

Customer-specific integrated circuit (CSIC)

Semiconductors; Test equipment

An alternative and possibly more accurate name for an ASIC, but this term is rarely used in the industry and shows little indication of finding favour with the masses.

Complex programmable logic device (CPLD)

Semiconductors; Test equipment

A programmable IC which is more complex than the original Programmable Logic Devices such as AMD's (originally MMI's) PALs but somewhat less complex than Field Programmable Logic Arrays.

Conducted susceptibility (CS)

Semiconductors; Test equipment

The determination or measurement of a device's capability to function in the presence of undesirable conducted EMI. This usually involves conduction through with the I/O cables, signal leads, or ...