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Test equipment

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Test equipment

JTAG switch module (JSM)

Semiconductors; Test equipment

A multiplexing switch, allowing a single Test Access Port to be used to operate one of a number of scan chains.

Imaginary number

Semiconductors; Test equipment

(j) - The square root of -1 is called an imaginary number and is designated as j or i.

Joule (J)

Semiconductors; Test equipment

The unit of work and energy.

Long term evolution (LTE)

Semiconductors; Test equipment

The name given to a project within the Third Generation Partnership Project (3GPP) to improve the Universal Mobile Telecommunications System (UMTS) mobile phone standard to cope with future ...

Mutation analysis (MA)

Semiconductors; Test equipment

A field of computer science involving the mutation of source code by introducing statements or modifying existing statements in small ways. The mutations are based on well-defined mutation operators ...

LAN extensions for instrumentation (LXI)

Semiconductors; Test equipment

LAN-based successor to GPIB. it goes beyond GPIB to provide additional capabilities that make it easier for system designers and integrators to create faster, more efficient systems. LXI is an ...

Molecular beam epitaxy (MBE)

Semiconductors; Test equipment

A technique for creating thin films on substrates in precise patterns, in which the substrate is placed in a high vacuum, and a guided beam of ionised molecules is fired at it, effectively allowing ...

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