Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Cathode ray tube (CRT)

Semiconductors; Test equipment

Vacuum tube used to display data in a visual form. Picture tube of a television or computer terminal.

Chip scale package (CSP)

Semiconductors; Test equipment

Active, multi-I/O package that is no larger than 125% of the size of the silicon IC.

Electrically erasable programmable read-only memory (EEPROM)

Semiconductors; Test equipment

Pronounced double-ee-prom or e-e-prom, short for electrically erasable programmable read-only memory. EEPROM is a special type of PROM that can be erased by exposing it to an electrical charge. Like ...

Effective competitive opportunities test (ECO test)

Semiconductors; Test equipment

Developed to determine whether U.S. carriers enjoy effective competition in a foreign carrier's market before granting U.S. market access to that foreign carrier. Following the Basic Telecom ...

Embedded logic test (ELT)

Semiconductors; Test equipment

A hierarchical test solution used to simplify the implementation of logic test for large chips. A logicTest controller is associated with each block module to perform an internal logic test. Logic in ...

Embedded deterministic test (EDT)

Semiconductors; Test equipment

A patented DFT technology from Mentor Graphics that creates highly compressed test vectors through the combination of embedding test logic in the scan paths and specialised deterministic test ...