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Test equipment
Industry: Semiconductors
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Test equipment
Data collection
Semiconductors; Test equipment
The collection of selected information in a file during a specified operation.
Cone of logic
Semiconductors; Test equipment
The combinational logic in a circuit that resolves to a single observe point.
Settling time
Semiconductors; Test equipment
The time required, after rapidly changing a circuit's input signal, for that circuit's output voltage to settle and remain within a specified error band around the final value.
Data reduction
Semiconductors; Test equipment
The transformation of raw data, such as that logged during a device-test run, to human-usable forms, such as graphical representations and tables.
Conversion time
Semiconductors; Test equipment
The time required from the moment a channel is interrogated to the moment that accurate data is available. Usually associated with DACs and ADCs.
Programmable logic levels
Semiconductors; Test equipment
The signal and reference voltage levels applied to the driver and comparator rails.
Waveform
Semiconductors; Test equipment
The succession of signal levels applied to the DUT pin after combining pattern and timing information.
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