Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Logistics supports analysis (LSA)

Semiconductors; Test equipment

A systems engineering and design process selectively applied during all life cycle phases of the system/equipment to help ensure supportability objectives are met. (MIL-STD-1785)

Logistics supports analysis record (LSAR)

Semiconductors; Test equipment

That portion of LSA documentation consisting of detailed data pertaining to the identification of logistic support resource requirements of an equipment.

Large scale integration (LSI)

Semiconductors; Test equipment

Arrays of ICs on a single substrate that comprise 100 or more individual active circuit functions or gates.

Milli

Semiconductors; Test equipment

(m) - Representing one thousandth = 0.001. For example, 1 thousandth of a second (1 millisecond) could be written as 1 ms or 1 mS.

Mega (M)

Semiconductors; Test equipment

Represents one million (1,000,000). For example, 1MHz = 1,000,000 Hz

Nondeterministic polynomial-time hard (NP-hard)

Semiconductors; Test equipment

In computational complexity theory, is a class of problems informally "at least as hard as problems in NP." A problem H is NP-hard if and only if there is an NP-complete problem L that is polynomial ...

Multiplexor, multiplexer (MUX)

Semiconductors; Test equipment

An electronic mult-position switch under the control of a digital computer, generally used in conjunction with an analog-to-digital converter, that allows for the selection of any one of a number of ...