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Test equipment

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Test equipment

Built In logic block observer (BILBO)

Semiconductors; Test equipment

A BILBO is a multitalented logic circuit that can be a state register, a scan register, an LFSR, or a MISR depending on the state of its mode pins. BILBOs are sometimes used to cascade large ...

Ball grid array (BGA)

Semiconductors; Test equipment

A component whose terminations are on the bottom of the package, and are in the shape of solder balls and in a grid array pattern. This generally covers components that have them in a full array or ...

Basic input/output system (BIOS)

Semiconductors; Test equipment

BIOS functions are the fundamental level of any PC or compatible computer. BIOS functions embody the basic operations needed for successful use of the computer's hardware resources.

Built-In repair analysis (BIRA)

Semiconductors; Test equipment

Technique used to determine if a memory is repairable and the repair information based on the specified redundancy scheme, i.e., spare IO or column, or spare row.

Build-in self analysis (BISA)

Semiconductors; Test equipment

A method related to Built-in Self Repair (BISR) that processes memory failure data to generate repair data.

Bit error rate tester (BERT)

Semiconductors; Test equipment

A procedure or device that measures the bit error rate of a transmission.

Binary decision diagram (BDD)

Semiconductors; Test equipment

A method of representing Boolean equations as decision trees.

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