Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

National institute of standads and technology (NIST)

Semiconductors; Test equipment

A non-regulatory agency of the United States Department of Commerce, NIST supplies standard reference materials of the highest quality and metrological value.

N-channel MOS or P-channel MOS (NMOS or PMOS)

Semiconductors; Test equipment

Refers to the order in which the semiconductor is doped in a MOS device. That is, which structures are constructed as N-type versus P-type material.

Non-return-to-zero (NRZ)

Semiconductors; Test equipment

A digital wave fomat. When a valid bit occurs in the cycle, the waveform switches to a "1" and stays at that value until the next cycle boundary.

No fault found (NFF)

Semiconductors; Test equipment

The event that results from a failure or fault being detected or reported during operations that cannot be verified at the lower level of maintenance.

Normal mode rejection (NMR)

Semiconductors; Test equipment

The amount of signal rejection at a certain frequency. Typically the frequency of the rejection is designed for electrical power frequencies such as 50 or 60 Hz.

Numerical aperture (NA)

Semiconductors; Test equipment

A term representative of the angle included by a cone of light accepted by the objective of a microscope. The higher the NA, the greater the resolving power.