Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Random access memory (RAM)

Semiconductors; Test equipment

A type of computer memory that can be accessed randomly; that is, any byte of memory can be accessed without touching the preceding bytes. RAM is the most common type of memory found in computers and ...

Refractive index (RI)

Semiconductors; Test equipment

The ratio of the speed of light in a vacuum to its speed in some other medium. This will determine how much light rays are bent. When using immersion objectives it is important to keep the values as ...

Reliability block diagram (RBD)

Semiconductors; Test equipment

A diagram the represents how the components (represented by "blocks") are arranged and related reliability-wise in a larger system. This is often, but not necessarily, the same as the way that the ...

Rectangular chip carrier (RCC)

Semiconductors; Test equipment

A chip carrier with unequal length and width dimensions.

Synchronous optical NERwork (SONET)

Semiconductors; Test equipment

The SONET format allows different types of formats to be transmitted on one line. SONET is a long term solution for a mid-span-meet between vendors. The other major advantage is that SONET allows ...

Statistical process control (SPC)

Semiconductors; Test equipment

The use of statistical techniques to analyse a process or its output to determine any variation from a benchmark and to take appropriate action to restore statistical control, if required.