22 Terms
Home > Industry/Domain > Semiconductors > Test equipment
Test equipment
Industry: Semiconductors
Add a new termContributors in Test equipment
Test equipment
Nyquist sampling theorem
Semiconductors; Test equipment
A theorem that states that if you sample a signal at rate f, the sampled signal will contain no information about signals with frequency components above f/2.
Test vector
Semiconductors; Test equipment
A test vector or test setup condition is a set of stimuli applied to the device-under-test (DUT) to elicit a known output at a given test measurement node.
Feature extraction
Semiconductors; Test equipment
A technique that generates a set of descriptors or characteristic attributes from a binary image.
Frame relay
Semiconductors; Test equipment
A technology for transmitting data packets in high-speed bursts across a digital network.
Spike
Semiconductors; Test equipment
A transient disturbance of an electrical circuit caused by, for example, load variations on the AC power line.
Edge detection
Semiconductors; Test equipment
A technique that locates an edge by examining an image for abrupt changes in pixel values.
Wafer
Semiconductors; Test equipment
A thin, polished slice of monolithic semiconductor on which an array of die are fabricated.
Featured User
Featured blossaries
pmss1990
0
Terms
1
Blossaries
0
Followers
Medecine: Immunodeficiency and pathophysiology
Category: Science 2 22 Terms
22 Terms