Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Advanced graphics port (AGP)

Semiconductors; Test equipment

A higher-speed version of the PCI bus using a different connector. Developed to accommodate the bandwidth needs of dedicated plug-in graphics cards in desktop PCs.

Four-terminal resistance measurement

Semiconductors; Test equipment

A measurement where two leads supply current to the unknown resistance and two different leads sense the voltage drop across it.

Kelvin measurement

Semiconductors; Test equipment

A measurement where two leads supply current to the unknown resistance and two different leads sense the voltage drop across it.

Beacon period occupancy information element (BPOIE)

Semiconductors; Test equipment

Contained in the payload of every beacon frame, the BPOIE reports the BP length and status of individual slots as seen by the device transmitting the frame. The slot info bitmap field communicates or ...

Built-In self repair (BISR)

Semiconductors; Test equipment

A memory repair method that goes beyond diagnostics to actually repair the device through redundancy selection when defects are detected.

Bill of material (BOM)

Semiconductors; Test equipment

Comprehensive listing of all subassemblies, components, and raw materials that go into a parent assembly, showing the quantity of each required to make the assembly.

Built-In test (BIT)

Semiconductors; Test equipment

An internal automatic or semiautomatic feature in a system or subsystem designed to detect, diagnose or isolate system failures by interrogating a system or monitoring system performance.