Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Sink current (active load)

Semiconductors; Test equipment

Conventional current flow into a DUT with the active load as pull-up.

Memory built in self test (MBIST)

Semiconductors; Test equipment

BIST approach that is specific to memory testing.

Quality measure for a test or set of tests, based on the percentage of actually detected faults (defects) versus the total number of theoretically detectable faults, on a particular fault model. A ...

Primary output

Semiconductors; Test equipment

Physical output to the outside world from a device, can be a signal output, a scan chain output, etc. (Note: In the case of cores in an SOC, the outside world may still be inside the chip).

Primary input

Semiconductors; Test equipment

Physical input from the outside world to a device, can be a signal input, a scan chain input, etc. (Note: In the case of cores in an SOC, the outside world may still be inside the chip).

Concurrent test

Semiconductors; Test equipment

Performing different tests simultaneously to one or more devices. For instance, you might be testing different BIST circuits simultaneously on the same chip. Alternatively, you might be testing ...