Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

Asynchronous transfer mode (ATM)

Semiconductors; Test equipment

A fast-packet switching technology that uses asynchronous time-division multiplexing.

Non-observable fault

Semiconductors; Test equipment

A fault is considered non-observable if its effects cannot be measured at any network output.

Clamp voltage

Semiconductors; Test equipment

A fixed voltage coupled by a diode or its equivalent to limit the voltage excursion of a transition or a current supply.

Band-pass philtre

Semiconductors; Test equipment

A philtre that passes only those signal frequencies between two set frequencies.

Passive philtre

Semiconductors; Test equipment

A philtre circuit using only passive components such as resistors, capacitors, and inductors.

Successive-approximation

Semiconductors; Test equipment

A technique used in ADCs that sequentially compares a series of progressively smaller binary-weighted values with an analogue input to produce an output digital word.

Go/no-go test

Semiconductors; Test equipment

A test with minimum and maximum limits that stops on the first error without performing any diagnostics, characterization, or actual measurements other than limit checking.