Home > Industry/Domain > Semiconductors > Test equipment

Test equipment

Contributors in Test equipment

Test equipment

Input isolation

Semiconductors; Test equipment

Any mechanism for isolating a core's inputs from the surrounding circuitry, such that the core completely ignores these inputs. This may be useful while testing the surrounding circuitry to prevent ...

Functional perturbation

Semiconductors; Test equipment

At the output of a functional macro (for example, a sub-circuit such as an amplifier), functional perturbation represents the deviation of the output from its nominal value due to a soft or hard ...

Automatic test equipment (ATE)

Semiconductors; Test equipment

An automated, usually computer-driven, approach to testing semiconductors, electronic circuits, and printed circuit board assemblies.

Output isolation

Semiconductors; Test equipment

Any mechanism for isolating a core's outputs from the surrounding circuitry, such that the surrounding circuitry may be tested without contention from the cores not under test.

False colour

Semiconductors; Test equipment

Colour added to an image to call attention to details that aren't readily perceptible or to create special effects.

Parametric fault

Semiconductors; Test equipment

Any fault caused by a parametric or process variation outside of tolerance or nominal values is called a soft fault.

Subpixel resolution

Semiconductors; Test equipment

Any imaging technique that can yield a measurement with a spatial resolution of less than one pixel.

Featured blossaries

Lego

Category: Entertainment   4 6 Terms

Famous Rock Blues Guitarist

Category: Entertainment   2 6 Terms