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Test equipment
Industry: Semiconductors
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Test equipment
Partial scan
Semiconductors; Test equipment
Scan architecture (implementation) where only some of the storage elements (flip-flops) are scannable.
Full scan
Semiconductors; Test equipment
Scan architecture (implementation) where all of the memory elements (flip-flops) are scannable in the design.
Blooming
Semiconductors; Test equipment
Saturation of light-sensing elements in a TV camera. Blooming causes clipping at the camera's maximum brightness level.
Defect level
Semiconductors; Test equipment
The fraction of devices shipped, which can be expected to be defective (ie. escapes) due to incomplete test coverage. Usually expressed as a percentage number.
Quantizing error
Semiconductors; Test equipment
The inherent uncertainty in digitising an analogue value that is caused by the finite resolution of the conversion process. Increasing the resolution of an ADC reduces the uncertainty.
Memory module
Semiconductors; Test equipment
The memory module, of which there may be two per board, contains either 18 M or 72 M of memory. This memory can be used for DBM, ECR or Vector testing.
